X-ray and transmission electron microscopy structural characterization of multifunctional Perovskite thin films
Identifieur interne : 000261 ( Main/Exploration ); précédent : 000260; suivant : 000262X-ray and transmission electron microscopy structural characterization of multifunctional Perovskite thin films
Auteurs : M. Boudard [France] ; C. Girardot [France] ; N. Ihzaz [France, Tunisie] ; S. Pignard [France] ; L. Rapenne [France] ; H. Roussel [France] ; A. Bartasyte [France]Source :
- Thin solid films [ 0040-6090 ] ; 2012.
Descripteurs français
- Pascal (Inist)
- Microscopie électronique transmission, Couche mince, Méthode MOCVD, Diffraction RX, Orientation cristalline, Structure cristalline, Réseau réciproque, Espace réciproque, Contrainte traction, Relaxation, Epaisseur couche, Effet dimensionnel, Diffusion en diffraction, Propriété transport, Perovskites, Titanate de plomb, Monocristal, Oxyde de samarium, Oxyde de nickel, Recuit, Propriété magnétique, PbTiO3, Substrat SrTiO3, Substrat LaAlO3, SmNiO3, NiO, 6855J, 8115G.
English descriptors
- KwdEn :
- Annealing, Crystal orientation, Crystal structure, Diffuse scattering, Layer thickness, Lead titanates, MOCVD, Magnetic properties, Monocrystals, Nickel oxide, Perovskites, Reciprocal lattice, Reciprocal space, Relaxation, Samarium oxides, Size effect, Tensile stress, Thin films, Transmission electron microscopy, Transport properties, XRD.
Abstract
Different multifunctional (PbTiO3, Sm0.6Nd0.4NiO3, NdMnO3) thin films were grown by metalorganic chemical vapor deposition (MOCVD) technique on SrTiO3 and LaAlO3 substrates. Transmission electron microscopy (TEM) and X-ray diffraction measurements reveal that almost single crystalline thin films can be epitaxially grown on the top of substrates. The relationship between the crystallographic orientation of the films and those of the substrates were determined by reciprocal space mapping and TEM analyses. PbTi03 thin films appear to be under tensile or compressive strain according to the different mismatch of their cell parameter with those of the substrate. Relaxation mechanism as a function of the film thickness arises from coexistence of different type of domains and size and strain effect are analyzed. SmNiO3 thin films present diffuse scattering strikes and are less well organized when compared to PbTi03 thin films. Different domains are observed as well as an additional parasitic phase close to NiO. Its regular distribution can be associated to reduced transport properties. Preliminary observations on NdMnO3 thin films shows that an amorphous phase is obtained during MOCVD that can be transformed in a single crystalline film by annealing. The films are under tensile or compressive strain according to the different mismatch of their cell parameter with those of the substrate. Magnetic properties are investigated.
Affiliations:
- France, Tunisie
- Auvergne-Rhône-Alpes, Gouvernorat de Monastir, Grand Est, Lorraine (région), Rhône-Alpes
- Grenoble, Monastir, Vandoeuvre-ls-Nancy
- Nancy-Université, Université de Monastir
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Le document en format XML
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Pignard</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Laboratoire des Matériaux et du Génie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Néel, BP 257</s1><s2>38016 Grenoble</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region><region type="old region" nuts="2">Rhône-Alpes</region><settlement type="city">Grenoble</settlement></placeName></affiliation></author><author><name sortKey="Rapenne, L" sort="Rapenne, L" uniqKey="Rapenne L" first="L." last="Rapenne">L. Rapenne</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Laboratoire des Matériaux et du Génie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Néel, BP 257</s1><s2>38016 Grenoble</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region><region type="old region" nuts="2">Rhône-Alpes</region><settlement type="city">Grenoble</settlement></placeName></affiliation></author><author><name sortKey="Roussel, H" sort="Roussel, H" uniqKey="Roussel H" first="H." last="Roussel">H. 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Boudard</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Laboratoire des Matériaux et du Génie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Néel, BP 257</s1><s2>38016 Grenoble</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region><region type="old region" nuts="2">Rhône-Alpes</region><settlement type="city">Grenoble</settlement></placeName></affiliation></author><author><name sortKey="Girardot, C" sort="Girardot, C" uniqKey="Girardot C" first="C." last="Girardot">C. Girardot</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Laboratoire des Matériaux et du Génie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Néel, BP 257</s1><s2>38016 Grenoble</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region><region type="old region" nuts="2">Rhône-Alpes</region><settlement type="city">Grenoble</settlement></placeName></affiliation><affiliation wicri:level="3"><inist:fA14 i1="02"><s1>Schneider Electric Industries S.A.S., 37 Quai Paul Louis Merlin</s1><s2>38050 Grenoble</s2><s3>FRA</s3><sZ>2 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region><region type="old region" nuts="2">Rhône-Alpes</region><settlement type="city">Grenoble</settlement></placeName></affiliation></author><author><name sortKey="Ihzaz, N" sort="Ihzaz, N" uniqKey="Ihzaz N" first="N." last="Ihzaz">N. Ihzaz</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Laboratoire des Matériaux et du Génie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Néel, BP 257</s1><s2>38016 Grenoble</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region><region type="old region" nuts="2">Rhône-Alpes</region><settlement type="city">Grenoble</settlement></placeName></affiliation><affiliation wicri:level="4"><inist:fA14 i1="03"><s1>Laboratoire de Physico-Chimie des Matériaux, Département de Physique, Faculté des Sciences de Monastir, 5019 Monastir, Université de Monastir</s1><s3>TUN</s3><sZ>3 aut.</sZ></inist:fA14><country>Tunisie</country><placeName><settlement type="city">Monastir</settlement><region type="region" nuts="2">Gouvernorat de Monastir</region></placeName><orgName type="university">Université de Monastir</orgName></affiliation></author><author><name sortKey="Pignard, S" sort="Pignard, S" uniqKey="Pignard S" first="S." last="Pignard">S. Pignard</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Laboratoire des Matériaux et du Génie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Néel, BP 257</s1><s2>38016 Grenoble</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region><region type="old region" nuts="2">Rhône-Alpes</region><settlement type="city">Grenoble</settlement></placeName></affiliation></author><author><name sortKey="Rapenne, L" sort="Rapenne, L" uniqKey="Rapenne L" first="L." last="Rapenne">L. Rapenne</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Laboratoire des Matériaux et du Génie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Néel, BP 257</s1><s2>38016 Grenoble</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region><region type="old region" nuts="2">Rhône-Alpes</region><settlement type="city">Grenoble</settlement></placeName></affiliation></author><author><name sortKey="Roussel, H" sort="Roussel, H" uniqKey="Roussel H" first="H." last="Roussel">H. Roussel</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Laboratoire des Matériaux et du Génie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Néel, BP 257</s1><s2>38016 Grenoble</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region><region type="old region" nuts="2">Rhône-Alpes</region><settlement type="city">Grenoble</settlement></placeName></affiliation></author><author><name sortKey="Bartasyte, A" sort="Bartasyte, A" uniqKey="Bartasyte A" first="A." last="Bartasyte">A. Bartasyte</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>Laboratoire des Matériaux et du Génie Physique, Grenoble INP, CNRS(UMR 5628), MINATEC, 3 parvis Louis Néel, BP 257</s1><s2>38016 Grenoble</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Auvergne-Rhône-Alpes</region><region type="old region" nuts="2">Rhône-Alpes</region><settlement type="city">Grenoble</settlement></placeName></affiliation><affiliation wicri:level="4"><inist:fA14 i1="04"><s1>P2M, Institut Jean Lamour, Nancy Université, Bd. des Aiguillettes</s1><s2>54506 Vandoeuvre-ls-Nancy</s2><s3>FRA</s3><sZ>7 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Grand Est</region><region type="old region" nuts="2">Lorraine (région)</region><settlement type="city">Vandoeuvre-ls-Nancy</settlement></placeName><orgName type="university">Nancy-Université</orgName></affiliation></author></analytic><series><title level="j" type="main">Thin solid films</title><title level="j" type="abbreviated">Thin solid films</title><idno type="ISSN">0040-6090</idno><imprint><date when="2012">2012</date></imprint></series></biblStruct></sourceDesc><seriesStmt><title level="j" type="main">Thin solid films</title><title level="j" type="abbreviated">Thin solid films</title><idno type="ISSN">0040-6090</idno></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Annealing</term><term>Crystal orientation</term><term>Crystal structure</term><term>Diffuse scattering</term><term>Layer thickness</term><term>Lead titanates</term><term>MOCVD</term><term>Magnetic properties</term><term>Monocrystals</term><term>Nickel oxide</term><term>Perovskites</term><term>Reciprocal lattice</term><term>Reciprocal space</term><term>Relaxation</term><term>Samarium oxides</term><term>Size effect</term><term>Tensile stress</term><term>Thin films</term><term>Transmission electron microscopy</term><term>Transport properties</term><term>XRD</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Microscopie électronique transmission</term><term>Couche mince</term><term>Méthode MOCVD</term><term>Diffraction RX</term><term>Orientation cristalline</term><term>Structure cristalline</term><term>Réseau réciproque</term><term>Espace réciproque</term><term>Contrainte traction</term><term>Relaxation</term><term>Epaisseur couche</term><term>Effet dimensionnel</term><term>Diffusion en diffraction</term><term>Propriété transport</term><term>Perovskites</term><term>Titanate de plomb</term><term>Monocristal</term><term>Oxyde de samarium</term><term>Oxyde de nickel</term><term>Recuit</term><term>Propriété magnétique</term><term>PbTiO3</term><term>Substrat SrTiO3</term><term>Substrat LaAlO3</term><term>SmNiO3</term><term>NiO</term><term>6855J</term><term>8115G</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">Different multifunctional (PbTiO<sub>3</sub>, Sm<sub>0.6</sub>Nd<sub>0.4</sub>NiO<sub>3</sub>, NdMnO<sub>3</sub>) thin films were grown by metalorganic chemical vapor deposition (MOCVD) technique on SrTiO<sub>3</sub> and LaAlO<sub>3</sub> substrates. Transmission electron microscopy (TEM) and X-ray diffraction measurements reveal that almost single crystalline thin films can be epitaxially grown on the top of substrates. The relationship between the crystallographic orientation of the films and those of the substrates were determined by reciprocal space mapping and TEM analyses. PbTi03 thin films appear to be under tensile or compressive strain according to the different mismatch of their cell parameter with those of the substrate. Relaxation mechanism as a function of the film thickness arises from coexistence of different type of domains and size and strain effect are analyzed. SmNiO<sub>3</sub> thin films present diffuse scattering strikes and are less well organized when compared to PbTi0<sub>3</sub> thin films. Different domains are observed as well as an additional parasitic phase close to NiO. Its regular distribution can be associated to reduced transport properties. Preliminary observations on NdMnO<sub>3</sub> thin films shows that an amorphous phase is obtained during MOCVD that can be transformed in a single crystalline film by annealing. The films are under tensile or compressive strain according to the different mismatch of their cell parameter with those of the substrate. Magnetic properties are investigated.</div></front></TEI><affiliations><list><country><li>France</li><li>Tunisie</li></country><region><li>Auvergne-Rhône-Alpes</li><li>Gouvernorat de Monastir</li><li>Grand Est</li><li>Lorraine (région)</li><li>Rhône-Alpes</li></region><settlement><li>Grenoble</li><li>Monastir</li><li>Vandoeuvre-ls-Nancy</li></settlement><orgName><li>Nancy-Université</li><li>Université de Monastir</li></orgName></list><tree><country name="France"><region name="Auvergne-Rhône-Alpes"><name sortKey="Boudard, M" sort="Boudard, M" uniqKey="Boudard M" first="M." last="Boudard">M. Boudard</name></region><name sortKey="Bartasyte, A" sort="Bartasyte, A" uniqKey="Bartasyte A" first="A." last="Bartasyte">A. Bartasyte</name><name sortKey="Bartasyte, A" sort="Bartasyte, A" uniqKey="Bartasyte A" first="A." last="Bartasyte">A. Bartasyte</name><name sortKey="Girardot, C" sort="Girardot, C" uniqKey="Girardot C" first="C." last="Girardot">C. Girardot</name><name sortKey="Girardot, C" sort="Girardot, C" uniqKey="Girardot C" first="C." last="Girardot">C. Girardot</name><name sortKey="Ihzaz, N" sort="Ihzaz, N" uniqKey="Ihzaz N" first="N." last="Ihzaz">N. Ihzaz</name><name sortKey="Pignard, S" sort="Pignard, S" uniqKey="Pignard S" first="S." last="Pignard">S. Pignard</name><name sortKey="Rapenne, L" sort="Rapenne, L" uniqKey="Rapenne L" first="L." last="Rapenne">L. Rapenne</name><name sortKey="Roussel, H" sort="Roussel, H" uniqKey="Roussel H" first="H." last="Roussel">H. Roussel</name></country><country name="Tunisie"><region name="Gouvernorat de Monastir"><name sortKey="Ihzaz, N" sort="Ihzaz, N" uniqKey="Ihzaz N" first="N." last="Ihzaz">N. Ihzaz</name></region></country></tree></affiliations></record>Pour manipuler ce document sous Unix (Dilib)
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|clé= Pascal:12-0243447
|texte= X-ray and transmission electron microscopy structural characterization of multifunctional Perovskite thin films
}}
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